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Effects of noises on curve fitting to the I-V characteristics of retarding filed analyzers
Sun, C. Y.1,2; Li, Y. L.1; Voldiner, I.3; Pan, L.4; Yan, N.1; Zhang, H.1; Xiao, C.1,3
2020-01-02
发表期刊RADIATION EFFECTS AND DEFECTS IN SOLIDS
ISSN1042-0150
通讯作者Xiao, C.(chijin.xiao@usask.ca)
摘要Retarding filed analyzers (RFAs) measure the ion velocity distribution in edge plasmas, leading to an estimate of the ion temperature and space potential through curve fitting. This paper describes the bi-directional RFA detector installed on the Experimental Advanced Superconducting Tokamak for edge plasma parameter measurements. The paper also describes a technique to compensate for a known induced noise using a dummy signal line and a method to reconstruct the I-V curve from the scanning voltage signal and the resultant ion current waveform. Fitting to experimental data and numerical simulations show that the I-V curve reconstruction method serves for both smoothing and induction noise compensation purposes.
关键词Retarding field analyzer noises electromagnetic induction tokamak ion temperature
DOI10.1080/10420150.2020.1718129
收录类别SCI
语种英语
资助项目National Natural Science Foundation of China[11705237] ; NSERC of Canada ; Sylvia Fedoruk Canadian Center for Nuclear Innovation
项目资助者National Natural Science Foundation of China ; NSERC of Canada ; Sylvia Fedoruk Canadian Center for Nuclear Innovation
WOS研究方向Nuclear Science & Technology ; Physics
WOS类目Nuclear Science & Technology ; Physics, Fluids & Plasmas ; Physics, Condensed Matter
WOS记录号WOS:000517368700004
出版者TAYLOR & FRANCIS LTD
引用统计
文献类型期刊论文
条目标识符http://ir.hfcas.ac.cn:8080/handle/334002/103864
专题中国科学院合肥物质科学研究院
通讯作者Xiao, C.
作者单位1.Chinese Acad Sci, Inst Plasma Phys, Hefei, Peoples R China
2.Univ Sci & Technol China, Dept Engn & Appl Phys, Hefei, Peoples R China
3.Univ Saskatchewan, Dept Phys & Engn Phys, Saskatoon, SK, Canada
4.Harker Sch, San Jose, CA USA
第一作者单位中科院等离子体物理研究所
通讯作者单位中科院等离子体物理研究所
推荐引用方式
GB/T 7714
Sun, C. Y.,Li, Y. L.,Voldiner, I.,et al. Effects of noises on curve fitting to the I-V characteristics of retarding filed analyzers[J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS,2020,175.
APA Sun, C. Y..,Li, Y. L..,Voldiner, I..,Pan, L..,Yan, N..,...&Xiao, C..(2020).Effects of noises on curve fitting to the I-V characteristics of retarding filed analyzers.RADIATION EFFECTS AND DEFECTS IN SOLIDS,175.
MLA Sun, C. Y.,et al."Effects of noises on curve fitting to the I-V characteristics of retarding filed analyzers".RADIATION EFFECTS AND DEFECTS IN SOLIDS 175(2020).
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