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A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring | |
Liu, Tongshun1; Zhu, Kunpeng2 | |
2021-04-01 | |
发表期刊 | IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS |
ISSN | 1551-3203 |
通讯作者 | Zhu, Kunpeng(zhukp@iamt.ac.cn) |
摘要 | Hidden semi-Markov model (HSMM) has been widely used in equipment condition monitoring. However, the HSMM is usually modeled in fixed working mode. It is incompetent to monitor the condition when the working mode is varying in the equipment's lifetime. In this article, taking time-varying working mode into account, we propose a novel switching HSMM (SHSMM) to represent the equipment's degradation process. The reciprocal of duration is modeled and utilized to quantize the influence of working mode on the degradation process. Compared to traditional HSMM and time-varying HMM, the proposed SHSMM has a more generalized form and a more powerful ability to describe the degradation process with time-varying working mode. The proposed SHSMM is then applied to tool wear monitoring with time-varying cutting mode. Experimental results show that, via the proposed SHSMM, the monitoring confidence increases and the estimation of remaining useful life has a great improvement. |
关键词 | Condition monitoring degradation process remaining useful life (RUL) switching hidden semi-Markov model (SHSMM) tool wear monitoring (TWM) |
DOI | 10.1109/TII.2020.3004445 |
收录类别 | SCI |
语种 | 英语 |
资助项目 | Natural Science Foundation of the Jiangsu Higher Education Institutions of China[19KJB460007] ; National Natural Science Foundation of China[51475443] ; National Natural Science Foundation of China[TII-20-1566] |
项目资助者 | Natural Science Foundation of the Jiangsu Higher Education Institutions of China ; National Natural Science Foundation of China |
WOS研究方向 | Automation & Control Systems ; Computer Science ; Engineering |
WOS类目 | Automation & Control Systems ; Computer Science, Interdisciplinary Applications ; Engineering, Industrial |
WOS记录号 | WOS:000607814600031 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.hfcas.ac.cn:8080/handle/334002/119779 |
专题 | 中国科学院合肥物质科学研究院 |
通讯作者 | Zhu, Kunpeng |
作者单位 | 1.Soochow Univ, Sch Mech & Elect Engn, Suzhou 215137, Peoples R China 2.Chinese Acad Sci, Hefei Inst Phys Sci, Inst Adv Mfg Technol, Changzhou 213164, Jiangsu, Peoples R China |
通讯作者单位 | 中科院合肥物质科学研究院先进制造技术研究所 |
推荐引用方式 GB/T 7714 | Liu, Tongshun,Zhu, Kunpeng. A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring[J]. IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS,2021,17. |
APA | Liu, Tongshun,&Zhu, Kunpeng.(2021).A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring.IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS,17. |
MLA | Liu, Tongshun,et al."A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring".IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS 17(2021). |
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