A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring

doi:10.1109/TII.2020.3004445

HFCAS OpenIR

	A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring
	Liu, Tongshun 1; Zhu, Kunpeng 2
	2021-04-01
发表期刊	IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS
ISSN	1551-3203
通讯作者	Zhu, Kunpeng(zhukp@iamt.ac.cn)
摘要	Hidden semi-Markov model (HSMM) has been widely used in equipment condition monitoring. However, the HSMM is usually modeled in fixed working mode. It is incompetent to monitor the condition when the working mode is varying in the equipment's lifetime. In this article, taking time-varying working mode into account, we propose a novel switching HSMM (SHSMM) to represent the equipment's degradation process. The reciprocal of duration is modeled and utilized to quantize the influence of working mode on the degradation process. Compared to traditional HSMM and time-varying HMM, the proposed SHSMM has a more generalized form and a more powerful ability to describe the degradation process with time-varying working mode. The proposed SHSMM is then applied to tool wear monitoring with time-varying cutting mode. Experimental results show that, via the proposed SHSMM, the monitoring confidence increases and the estimation of remaining useful life has a great improvement.
关键词	Condition monitoring degradation process remaining useful life (RUL) switching hidden semi-Markov model (SHSMM) tool wear monitoring (TWM)
DOI	10.1109/TII.2020.3004445
收录类别	SCI
语种	英语
资助项目	Natural Science Foundation of the Jiangsu Higher Education Institutions of China[19KJB460007] ; National Natural Science Foundation of China[51475443] ; National Natural Science Foundation of China[TII-20-1566]
项目资助者	Natural Science Foundation of the Jiangsu Higher Education Institutions of China ; National Natural Science Foundation of China
WOS研究方向	Automation & Control Systems ; Computer Science ; Engineering
WOS类目	Automation & Control Systems ; Computer Science, Interdisciplinary Applications ; Engineering, Industrial
WOS记录号	WOS:000607814600031
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
引用统计	被引频次：28[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.hfcas.ac.cn:8080/handle/334002/119779
专题	中国科学院合肥物质科学研究院
通讯作者	Zhu, Kunpeng
作者单位	1.Soochow Univ, Sch Mech & Elect Engn, Suzhou 215137, Peoples R China 2.Chinese Acad Sci, Hefei Inst Phys Sci, Inst Adv Mfg Technol, Changzhou 213164, Jiangsu, Peoples R China
通讯作者单位	中科院合肥物质科学研究院先进制造技术研究所
推荐引用方式 GB/T 7714	Liu, Tongshun,Zhu, Kunpeng. A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring[J]. IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS,2021,17.
APA	Liu, Tongshun,&Zhu, Kunpeng.(2021).A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring.IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS,17.
MLA	Liu, Tongshun,et al."A Switching Hidden Semi-Markov Model for Degradation Process and Its Application to Time-Varying Tool Wear Monitoring".IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS 17(2021).