Thermal Contraction of Electrodeposited Bi

HFCAS OpenIR

	Thermal Contraction of Electrodeposited Bi
其他题名	Thermal Contraction of Electrodeposited Bi
	XC Dou; GH Li; XH Huang; L Li
	2010
发表期刊	Nanoscale Research Letters
ISSN	1556-276X
摘要	The lattice parameter of Bi/BiSb superlattice nanowire (SLNW) has been measured using in situ high-temperature X-ray diffraction method. The single crystalline Bi/BiSb SLNW arrays with different bilayer thicknesses have been fabricated within the porous anodic alumina membranes (AAMs) by a charge-controlled pulse electrodeposition. Different temperature dependences of the lattice parameter and thermal expansion coefficient were found for the SLNWs. It was found that the thermal expansion coefficient of the SLNWs with a large bilayer thickness has weak temperature dependence, and the interface stress and defect are the main factors responsible for the thermal contraction of the SLNWs.
其他摘要	The lattice parameter of Bi
语种	英语
文献类型	期刊论文
条目标识符	http://ir.hfcas.ac.cn:8080/handle/334002/124183
专题	中国科学院合肥物质科学研究院
作者单位	中国科学院固体物理研究所
推荐引用方式 GB/T 7714	XC Dou,GH Li,XH Huang,et al. Thermal Contraction of Electrodeposited Bi[J]. Nanoscale Research Letters,2010,5.
APA	XC Dou,GH Li,XH Huang,&L Li.(2010).Thermal Contraction of Electrodeposited Bi.Nanoscale Research Letters,5.
MLA	XC Dou,et al."Thermal Contraction of Electrodeposited Bi".Nanoscale Research Letters 5(2010).