Electron thermal internal transport barriers triggered by the effect of ion shielding

doi:10.1088/1741-4326/ac9c18

HFCAS OpenIR

	Electron thermal internal transport barriers triggered by the effect of ion shielding
	Ye, Lei1 ; Luo, Zhengping1 ; Xiao, Xiaotao1 ; Pan, Chengkang1 ; Wang, Yuehang 1; Huang, Yao1 ; Zang, Qing1 ; Chen, Fei1 ; Jin, Yifei 1; Wang, Shouxin1 ; Ding, Bojiang1 ; Xiao, Bingjia1 ; Wang, Shaojie 2
	2022-12-01
Source Publication	NUCLEAR FUSION
ISSN	0029-5515
Corresponding Author	Xiao, Bingjia(bjxiao@ipp.ac.cn) ; Wang, Shaojie(wangsj@ustc.edu.cn)
Abstract	The formation of electron thermal internal transport barriers (eITBs) is investigated by critical gradient threshold analysis for recent EAST experiments with dominant RF heating and low torque injection. The ratio of electron temperature to ion temperature, tau = T (e)/T (i), is identified to be the key parameter that triggers eITB in the hot electron mode through electron turbulence suppression by the effect of ion shielding. The critical gradient of electron-temperature-gradient turbulence can be greatly increased with tau due to strong electron heating and weak electron-ion energy coupling. The formation and evolution of eITB is found to be determined by the critical temperature gradient of electron turbulence.
Keyword	ETG turbulence transport TEM electron transport barrier
DOI	10.1088/1741-4326/ac9c18
Indexed By	SCI
Language	英语
Funding Project	National MCF Energy R&D Program of China ; National Natural Science Foundation of China ; [2018YFE0302100] ; [2019YFE03060000] ; [2019YFE03040004] ; [11875254] ; [12075240]
Funding Organization	National MCF Energy R&D Program of China ; National Natural Science Foundation of China
WOS Research Area	Physics
WOS Subject	Physics, Fluids & Plasmas
WOS ID	WOS:000885593900001
Publisher	IOP Publishing Ltd
Citation statistics
Document Type	期刊论文
Identifier	http://ir.hfcas.ac.cn:8080/handle/334002/130348
Collection	中国科学院合肥物质科学研究院
Corresponding Author	Xiao, Bingjia; Wang, Shaojie
Affiliation	1.Chinese Acad Sci, Inst Plasma Phys, Hefei 230031, Peoples R China 2.Univ Sci & Technol China, Hefei 230026, Peoples R China
First Author Affilication	Chinese Academy of Sciences, Institute of Plasma Physics, Hefei 230031, Anhui, Peoples R China
Corresponding Author Affilication	Chinese Academy of Sciences, Institute of Plasma Physics, Hefei 230031, Anhui, Peoples R China
Recommended Citation GB/T 7714	Ye, Lei,Luo, Zhengping,Xiao, Xiaotao,et al. Electron thermal internal transport barriers triggered by the effect of ion shielding[J]. NUCLEAR FUSION,2022,62.
APA	Ye, Lei.,Luo, Zhengping.,Xiao, Xiaotao.,Pan, Chengkang.,Wang, Yuehang.,...&Wang, Shaojie.(2022).Electron thermal internal transport barriers triggered by the effect of ion shielding.NUCLEAR FUSION,62.
MLA	Ye, Lei,et al."Electron thermal internal transport barriers triggered by the effect of ion shielding".NUCLEAR FUSION 62(2022).

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