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Interface control and modification of band alignment and electrical properties of HfTiO/GaAs gate stacks by nitrogen incorporation
Gang He1,3; Jiangwei Liu2; Hanshuang Chen1; Yanmei Liu1; Zhaoqi Sun1; Xiaoshuang Chen3; Mao Liu4; Lide Zhang4
2014
发表期刊J. Mater. Chem. C
WOS记录号WOS:000338601800007
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被引频次:140[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.hfcas.ac.cn:8080/handle/334002/20763
专题中科院固体物理研究所
作者单位1.School of Physics and Materials Science, Radiation Detection Materials & Devices Lab, Anhui University, Hefei 230039, P.R. China.
2.Optical and Electronic Materials Unit, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan.
3.National Laboratory for Infrared Physics, Chinese Academy of Sciences, Shanghai Institute of Technical Physics, 500 Yutian Road, Shanghai 200083, P.R. China
4.Key Laboratory of Materials Physics, Anhui Key Laboratory of Nanomaterials and Nanostructure, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031, P.R. China
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GB/T 7714
Gang He,Jiangwei Liu,Hanshuang Chen,et al. Interface control and modification of band alignment and electrical properties of HfTiO/GaAs gate stacks by nitrogen incorporation[J]. J. Mater. Chem. C,2014,2(27):5299-5308.
APA Gang He.,Jiangwei Liu.,Hanshuang Chen.,Yanmei Liu.,Zhaoqi Sun.,...&Lide Zhang.(2014).Interface control and modification of band alignment and electrical properties of HfTiO/GaAs gate stacks by nitrogen incorporation.J. Mater. Chem. C,2(27),5299-5308.
MLA Gang He,et al."Interface control and modification of band alignment and electrical properties of HfTiO/GaAs gate stacks by nitrogen incorporation".J. Mater. Chem. C 2.27(2014):5299-5308.
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