中文版 | English
HFCAS OpenIR  > 中科院固体物理研究所
Ion radiation albedo effect: influence of surface roughness on ion implantation and sputtering of materials
Li, Yonggang1,2,5; Yang, Yang2; Short, Michael P.2; Ding, Zejun3,4; Zeng, Zhi1,5; Li, Ju2,6
2017
发表期刊NUCLEAR FUSION
摘要In fusion devices, ion retention and sputtering of materials are major concerns in the selection of compatible plasma-facing materials (PFMs), especially in the context of their microstructural conditions and surface morphologies. We demonstrate how surface roughness changes ion implantation and sputtering of materials under energetic ion irradiation. Using a new, sophisticated 3D Monte Carlo (MC) code, IM3D, and a random rough surface model, ion implantation and the sputtering yields of tungsten (W) with a surface roughness varying between 0-2 mu m have been studied for irradiation by 0.1-1 keV D+, He+ and Ar+ ions. It is found that both ion backscattering and sputtering yields decrease with increasing roughness; this is hereafter called the ion radiation albedo effect. This effect is mainly dominated by the direct, line-of-sight deposition of a fraction of emitted atoms onto neighboring asperities. Backscattering and sputtering increase with more oblique irradiation angles. We propose a simple analytical formula to relate rough-surface and smooth-surface results.
文章类型Article
关键词Ion radiatIon Albedo Effect Surface Roughness Ion implantatIon And Sputtering Plasma-facing Materials Monte Carlo
WOS标题词Science & Technology ; Physical Sciences
DOI10.1088/1741-4326/57/1/016038
关键词[WOS]SCANNING-ELECTRON-MICROSCOPY ; MONTE-CARLO-SIMULATION ; LOW-ENERGY HELIUM ; MOLECULAR-DYNAMICS ; SECONDARY-ELECTRON ; ANGULAR-DEPENDENCE ; TUNGSTEN ; IRRADIATION ; YIELD ; NANOSTRUCTURES
收录类别SCI
语种英语
项目资助者National Natural Science Foundation of China(11275229 ; National Natural Science Foundation of China(11275229 ; National Natural Science Foundation of China(11275229 ; National Natural Science Foundation of China(11275229 ; National Natural Science Foundation of China(11275229 ; National Natural Science Foundation of China(11275229 ; National Natural Science Foundation of China(11275229 ; National Natural Science Foundation of China(11275229 ; key project of the National Science Foundation of China(11534012) ; key project of the National Science Foundation of China(11534012) ; key project of the National Science Foundation of China(11534012) ; key project of the National Science Foundation of China(11534012) ; key project of the National Science Foundation of China(11534012) ; key project of the National Science Foundation of China(11534012) ; key project of the National Science Foundation of China(11534012) ; key project of the National Science Foundation of China(11534012) ; Special Funds for the Major State Basic Research Project of China (973)(2012CB933702) ; Special Funds for the Major State Basic Research Project of China (973)(2012CB933702) ; Special Funds for the Major State Basic Research Project of China (973)(2012CB933702) ; Special Funds for the Major State Basic Research Project of China (973)(2012CB933702) ; Special Funds for the Major State Basic Research Project of China (973)(2012CB933702) ; Special Funds for the Major State Basic Research Project of China (973)(2012CB933702) ; Special Funds for the Major State Basic Research Project of China (973)(2012CB933702) ; Special Funds for the Major State Basic Research Project of China (973)(2012CB933702) ; Youth Innovation Promotion Association of CAS(2016386) ; Youth Innovation Promotion Association of CAS(2016386) ; Youth Innovation Promotion Association of CAS(2016386) ; Youth Innovation Promotion Association of CAS(2016386) ; Youth Innovation Promotion Association of CAS(2016386) ; Youth Innovation Promotion Association of CAS(2016386) ; Youth Innovation Promotion Association of CAS(2016386) ; Youth Innovation Promotion Association of CAS(2016386) ; CASHIPS ; CASHIPS ; CASHIPS ; CASHIPS ; CASHIPS ; CASHIPS ; CASHIPS ; CASHIPS ; NSF(DMR-1410636 ; NSF(DMR-1410636 ; NSF(DMR-1410636 ; NSF(DMR-1410636 ; NSF(DMR-1410636 ; NSF(DMR-1410636 ; NSF(DMR-1410636 ; NSF(DMR-1410636 ; U.S. Nuclear Regulatory Commission (NRC)(NRC-HQ-84-15-G-0045) ; U.S. Nuclear Regulatory Commission (NRC)(NRC-HQ-84-15-G-0045) ; U.S. Nuclear Regulatory Commission (NRC)(NRC-HQ-84-15-G-0045) ; U.S. Nuclear Regulatory Commission (NRC)(NRC-HQ-84-15-G-0045) ; U.S. Nuclear Regulatory Commission (NRC)(NRC-HQ-84-15-G-0045) ; U.S. Nuclear Regulatory Commission (NRC)(NRC-HQ-84-15-G-0045) ; U.S. Nuclear Regulatory Commission (NRC)(NRC-HQ-84-15-G-0045) ; U.S. Nuclear Regulatory Commission (NRC)(NRC-HQ-84-15-G-0045) ; Extreme Science and Engineering Discovery Environment (XSEDE)(TG-DMR130038) ; Extreme Science and Engineering Discovery Environment (XSEDE)(TG-DMR130038) ; Extreme Science and Engineering Discovery Environment (XSEDE)(TG-DMR130038) ; Extreme Science and Engineering Discovery Environment (XSEDE)(TG-DMR130038) ; Extreme Science and Engineering Discovery Environment (XSEDE)(TG-DMR130038) ; Extreme Science and Engineering Discovery Environment (XSEDE)(TG-DMR130038) ; Extreme Science and Engineering Discovery Environment (XSEDE)(TG-DMR130038) ; Extreme Science and Engineering Discovery Environment (XSEDE)(TG-DMR130038) ; Ministry of Education of China(20123402110034) ; Ministry of Education of China(20123402110034) ; Ministry of Education of China(20123402110034) ; Ministry of Education of China(20123402110034) ; Ministry of Education of China(20123402110034) ; Ministry of Education of China(20123402110034) ; Ministry of Education of China(20123402110034) ; Ministry of Education of China(20123402110034) ; '111' project(B07033) ; '111' project(B07033) ; '111' project(B07033) ; '111' project(B07033) ; '111' project(B07033) ; '111' project(B07033) ; '111' project(B07033) ; '111' project(B07033) ; 11475215 ; 11475215 ; 11475215 ; 11475215 ; 11475215 ; 11475215 ; 11475215 ; 11475215 ; DMR-1120901) ; DMR-1120901) ; DMR-1120901) ; DMR-1120901) ; DMR-1120901) ; DMR-1120901) ; DMR-1120901) ; DMR-1120901) ; NSAF U1230202 ; NSAF U1230202 ; NSAF U1230202 ; NSAF U1230202 ; NSAF U1230202 ; NSAF U1230202 ; NSAF U1230202 ; NSAF U1230202 ; 11274288 ; 11274288 ; 11274288 ; 11274288 ; 11274288 ; 11274288 ; 11274288 ; 11274288 ; 11574289) ; 11574289) ; 11574289) ; 11574289) ; 11574289) ; 11574289) ; 11574289) ; 11574289)
WOS研究方向Physics
WOS类目Physics, Fluids & Plasmas
WOS记录号WOS:000391632400001
引用统计
文献类型期刊论文
条目标识符http://ir.hfcas.ac.cn:8080/handle/334002/30282
专题中科院固体物理研究所
作者单位1.Chinese Acad Sci, Inst Solid State Phys, Key Lab Mat Phys, Hefei 230031, Peoples R China
2.MIT, Dept Nucl Sci & Engn, 77 Massachusetts Ave, Cambridge, MA 02139 USA
3.Univ Sci & Technol China, Hefei Natl Lab Phys Sci Microscale, Hefei 230026, Peoples R China
4.Univ Sci & Technol China, Dept Phys, Hefei 230026, Peoples R China
5.Univ Sci & Technol China, Hefei 230026, Peoples R China
6.MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
推荐引用方式
GB/T 7714		 Li, Yonggang,Yang, Yang,Short, Michael P.,et al. Ion radiation albedo effect: influence of surface roughness on ion implantation and sputtering of materials[J]. NUCLEAR FUSION,2017,57(1):1-12.
APA Li, Yonggang,Yang, Yang,Short, Michael P.,Ding, Zejun,Zeng, Zhi,&Li, Ju.(2017).Ion radiation albedo effect: influence of surface roughness on ion implantation and sputtering of materials.NUCLEAR FUSION,57(1),1-12.
MLA Li, Yonggang,et al."Ion radiation albedo effect: influence of surface roughness on ion implantation and sputtering of materials".NUCLEAR FUSION 57.1(2017):1-12.
条目包含的文件 下载所有文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
Ion radiation albedo（5115KB）期刊论文作者接受稿开放获取CC BY-NC-SA浏览 下载
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Li, Yonggang]的文章
[Yang, Yang]的文章
[Short, Michael P.]的文章
百度学术
百度学术中相似的文章
[Li, Yonggang]的文章
[Yang, Yang]的文章
[Short, Michael P.]的文章
必应学术
必应学术中相似的文章
[Li, Yonggang]的文章
[Yang, Yang]的文章
[Short, Michael P.]的文章
相关权益政策
暂无数据
收藏/分享
文件名： Ion radiation albedo effect_ influence of surface roughness on ion implantation and sputtering of materials.pdf
格式： Adobe PDF
所有评论 (0)
暂无评论
 

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。