Study of the Influence of Helical Bending Strain and Perpendicular Self-Field on Critical Current Degradation for Multilayer YBCO Tapes

doi:10.1109/TASC.2016.2607157

	Study of the Influence of Helical Bending Strain and Perpendicular Self-Field on Critical Current Degradation for Multilayer YBCO Tapes
	Zhang, Junsheng 1,2; Zheng, Jinxing1,3 ; Song, Yuntao 1,3; Jiang, Feng2 ; Wang, Xianghui 2
	2016-12-01
发表期刊	IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
摘要	An experimental investigation of the critical current (Ic) degradation of multilayer twisted yttrium barium copper oxide (YBCO) tapes in self-field was performed. The influence of the number of tape layers (N) and twist pitch (P) on critical current was researched. The results showed that the influence of helical bending strain and perpendicular self-field on critical current degradation was a comprehensive process. No critical current degradation was found when there was just one layer and the twist pitch was over 20 mm. However, the situation would change when the number of tape layers increased. The critical current degradation would increase with increase in helical bending strain or perpendicular self-field. The critical current degradation can reach a maximum of 24.6% when the helical bending strain was 0.23% and the number of tape layers was 5. A mathematic formula was set up to express the comprehensive influence of helical bending strain and perpendicular self-field on critical current degradation. The results can provide an important theoretical foundation for the application of high temperature superconducting tapes and the design of YBCO cables.
文章类型	Article
关键词	Critical Current Perpendicular Self-field Tape Layer Twist Pitch Yttrium Barium Copper Oxide (Ybco)
WOS标题词	Science & Technology ; Technology ; Physical Sciences
DOI	10.1109/TASC.2016.2607157
关键词[WOS]	COATED CONDUCTORS ; LAYERS
收录类别	SCI
语种	英语
项目资助者	National Natural Science Foundation of China(51507173) ; National Natural Science Foundation of China(51507173) ; National Natural Science Foundation of China(51507173) ; National Natural Science Foundation of China(51507173) ; National Natural Science Foundation of China(51507173) ; National Natural Science Foundation of China(51507173) ; National Natural Science Foundation of China(51507173) ; National Natural Science Foundation of China(51507173) ; Natural Science Foundation of Anhui Province(1608085QE93) ; Natural Science Foundation of Anhui Province(1608085QE93) ; Natural Science Foundation of Anhui Province(1608085QE93) ; Natural Science Foundation of Anhui Province(1608085QE93) ; Natural Science Foundation of Anhui Province(1608085QE93) ; Natural Science Foundation of Anhui Province(1608085QE93) ; Natural Science Foundation of Anhui Province(1608085QE93) ; Natural Science Foundation of Anhui Province(1608085QE93)
WOS研究方向	Engineering ; Physics
WOS类目	Engineering, Electrical & Electronic ; Physics, Applied
WOS记录号	WOS:000401834900001
引用统计	被引频次：6[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.hfcas.ac.cn:8080/handle/334002/33423
专题	中科院等离子体物理研究所
作者单位	1.Chinese Acad Sci, Hefei Inst Phys Sci, Inst Plasma Phys, Hefei 230031, Anhui, Peoples R China 2.Univ Sci & Technol China, Hefei 230031, Anhui, Peoples R China 3.Univ Sci & Technol China, Sch Nucl Sci & Technol, Hefei 230031, Anhui, Peoples R China
推荐引用方式 GB/T 7714	Zhang, Junsheng,Zheng, Jinxing,Song, Yuntao,et al. Study of the Influence of Helical Bending Strain and Perpendicular Self-Field on Critical Current Degradation for Multilayer YBCO Tapes[J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY,2016,26(8).
APA	Zhang, Junsheng,Zheng, Jinxing,Song, Yuntao,Jiang, Feng,&Wang, Xianghui.(2016).Study of the Influence of Helical Bending Strain and Perpendicular Self-Field on Critical Current Degradation for Multilayer YBCO Tapes.IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY,26(8).
MLA	Zhang, Junsheng,et al."Study of the Influence of Helical Bending Strain and Perpendicular Self-Field on Critical Current Degradation for Multilayer YBCO Tapes".IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY 26.8(2016).