HFCAS OpenIR  > 中科院安徽光学精密机械研究所
一种采用X射线荧光光谱检测重金属的薄膜标准品的制备装置及其应用
甘婷婷; 张玉钧; 殷高方; 赵南京; 刘建国; 刘文清
2016
Rights Holder中国科学院合肥物质科学研究院
Country中国
Subtype发明专利
Patent Number201410616682.9
Language中文
Document Type专利
Identifierhttp://ir.hfcas.ac.cn:8080/handle/334002/33934
Collection中科院安徽光学精密机械研究所
Affiliation中国科学院安徽光学精密机械研究所, 合肥 230031
Recommended Citation
GB/T 7714
甘婷婷,张玉钧,殷高方,等. 一种采用X射线荧光光谱检测重金属的薄膜标准品的制备装置及其应用. 201410616682.9[P]. 2016-01-01.
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