HFCAS OpenIR  > 中科院安徽光学精密机械研究所
薄膜法X射线荧光测量中样品检测位置及防护铅板内衬材料的选择研究
甘婷婷; 张玉钧; 赵南京; 殷高方; 董欣欣; 王亚萍; 刘建国; 刘文清
2015
Source Publication光谱学与光谱分析
Volume35Issue:1Pages:252-257
Language中文
Document Type期刊论文
Identifierhttp://ir.hfcas.ac.cn:8080/handle/334002/33969
Collection中科院安徽光学精密机械研究所
Affiliation中国科学院安徽光学精密机械研究所,环境光学与技术重点实验室,安徽 合肥  23003
Recommended Citation
GB/T 7714
甘婷婷,张玉钧,赵南京,等. 薄膜法X射线荧光测量中样品检测位置及防护铅板内衬材料的选择研究[J]. 光谱学与光谱分析,2015,35(1):252-257.
APA 甘婷婷.,张玉钧.,赵南京.,殷高方.,董欣欣.,...&刘文清.(2015).薄膜法X射线荧光测量中样品检测位置及防护铅板内衬材料的选择研究.光谱学与光谱分析,35(1),252-257.
MLA 甘婷婷,et al."薄膜法X射线荧光测量中样品检测位置及防护铅板内衬材料的选择研究".光谱学与光谱分析 35.1(2015):252-257.
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