HFCAS OpenIR  > 中科院安徽光学精密机械研究所
样品厚度对薄膜法X射线荧光光谱测量的影响研究
甘婷婷1,2; 张玉钧1; 赵南京1; 殷高方1; 肖   雪1; 章   炜3; 刘建国1; 刘文清1
2016
Source Publication光谱学与光谱分析
Volume36Issue:12Pages:4039-4044
Language中文
Document Type期刊论文
Identifierhttp://ir.hfcas.ac.cn:8080/handle/334002/33976
Collection中科院安徽光学精密机械研究所
Affiliation1.中国科学院安徽光学精密机械研究所,环境光学与技术重点实验室,安徽省环境光学监测技术重点实验室,安徽 合肥  230031
2.皖江新兴产业技术发展中心,安徽 铜陵  244000
3.中国人民解放军陆军军官学院,安徽 合肥  230031
Recommended Citation
GB/T 7714
甘婷婷,张玉钧,赵南京,等. 样品厚度对薄膜法X射线荧光光谱测量的影响研究[J]. 光谱学与光谱分析,2016,36(12):4039-4044.
APA 甘婷婷.,张玉钧.,赵南京.,殷高方.,肖   雪.,...&刘文清.(2016).样品厚度对薄膜法X射线荧光光谱测量的影响研究.光谱学与光谱分析,36(12),4039-4044.
MLA 甘婷婷,et al."样品厚度对薄膜法X射线荧光光谱测量的影响研究".光谱学与光谱分析 36.12(2016):4039-4044.
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